N. Johnson,
O. Herrwerth,
A. Wirth,
S. De,
I. Ben-Itzhak,
M. Lezius,
B. Bergues,
M. F. Kling,
A. Senftleben,
C. D. Schröter,
R. Moshammer,
J. Ullrich,
K. J. Betsch,
R. R. Jones,
A. M. Sayler,
T. Rathje,
K. Rühle,
W. Müller,
and G.G. Paulus
Single-shot carrier-envelope-phase-tagged ion-momentum imaging of nonsequential double ionization of argon in intense 4-fs laser fields
Phys. Rev. A, 83 :013412 (January 2011)
Single-shot carrier-envelope-phase-tagged ion-momentum imaging of nonsequential double ionization of argon in intense 4-fs laser fields
Phys. Rev. A, 83 :013412 (January 2011)
Abstract:
Single-shot carrier-envelope-phase (CEP) tagging is combined with a reaction mircoscope (REMI) to investigate CEP-dependent processes in atoms. Excellent experimental stability and data acquisition longevity are achieved. Using this approach, we study the CEP effects for nonsequential double ionization of argon in 4-fs laser fields at 750 nm and an intensity of 1.6 × 10^14 W/cm2. The Ar^(2+) ionization yield shows a pronounced CEP dependence which compares well with recent theoretical predictions employing quantitative rescattering theory [S. Micheau et al. Phys. Rev. A 79 013417 (2009)]. Furthermore, we find strong CEP influences on the Ar^(2+) momentum spectra along the laser polarization axis.