G. Tadesse,
W. Eschen,
R. Klas,
V. Hilbert,
D. Schelle,
A. Nathanael,
M. Zilk,
M. Steinert,
F. Schrempel,
T. Pertsch,
A. Tünnermann,
J. Limpert,
and J. Rothhardt
High resolution XUV Fourier transform holography on a table top
Sci. Rep., 8 :8677 (June 2018)
High resolution XUV Fourier transform holography on a table top
Sci. Rep., 8 :8677 (June 2018)
Abstract:
Today, coherent imaging techniques provide the highest resolution in the extreme ultraviolet (XUV) and X-ray regions. Fourier transform holography (FTH) is particularly unique, providing robust and straightforward image reconstruction at the same time. Here, we combine two important advances: First, our experiment is based on a table-top light source which is compact, scalable and highly accessible. Second, we demonstrate the highest resolution ever achieved with FTH at any light source (34 nm) by utilizing a high photon flux source and cutting-edge nanofabrication technology. The performance, versatility and reliability of our approach allows imaging of complex wavelength-scale structures, including wave guiding effects within these structures, and resolving embedded nanoscale features, which are invisible for electron microscopes. Our work represents an important step towards real-world applications and a broad use of XUV imaging in many areas of science and technology. Even nanoscale studies of ultra-fast dynamics are within reach.