U. Zastrau,
and E. Förster
Integrated reflectivity measurements of hydrogen phthalate crystals for high-resolution soft x-ray spectroscopy
J. Instrum., 9 :P09008 (September 2014)
Integrated reflectivity measurements of hydrogen phthalate crystals for high-resolution soft x-ray spectroscopy
J. Instrum., 9 :P09008 (September 2014)
Abstract:
The integrated x-ray reflectivity of Potassium Hydrogen Phthalate (KAP) and Rubidium Hydrogen Phthalate (RAP) crystals is studied at a photon energy of (1740±14) eV using a double-crystal setup. The absolute measured reflectivities are in < 5% agreement with the values predicted by the dynamic diffraction theory for perfect crystals when absorption is included. Within 4% experimental error margins, specimen that were exposed to ambient conditions over many years show identical reflectivity as specimen that were cleaved just before the measurement. No differences are observed between cleaving off a 10 μm surface layer and splitting the entire crystal bulk of 2 mm thickness. We conclude that at 1.7 keV photon energy the penetration depth of ~ 1 μm is large compared to a potentially deteriorated surface layer of a few 10 nm.