Electron beam ion traps (EBITs) can be used to provide targets of highly charged ions for synchrotrons and free-electron lasers. By observing resonantly excited fluorescence as well as changes in ion charge state, induced by resonant photoionization, it is possible to measure precise wavelengths, natural line widths, and branching ratios. This allows to benchmark atomic theory and provides valuable data for the interpretation of astrophysical observations. A novel compact EBIT offers the means to establish a X-ray wavelength reference based on electronic transitions.
- Seminarraum HI-Jena, Fröbelstieg 3
- Datum (Start der Veranstaltung)