M. Kübel,
K. J. Betsch,
N. Johnson,
U. Kleineberg,
R. Moshammer,
J. Ullrich,
G.G. Paulus,
M. F. Kling,
and B. Bergues
Carrier-envelope-phase tagging in measurements with long acquisition times
New J. Phys., 14 :093027 (September 2012)
Carrier-envelope-phase tagging in measurements with long acquisition times
New J. Phys., 14 :093027 (September 2012)
Abstract:
We present a detailed analysis of the systematic errors that affect single-shot carrier envelope phase (CEP) measurements in experiments with long acquisition times, for which only limited long-term laser stability can be achieved. After introducing a scheme for eliminating these systematic errors to a large extent, we apply our approach to investigate the CEP dependence of the yield of doubly charged ions produced via non-sequential double ionization of argon in strong near-single-cycle laser pulses. The experimental results are compared to predictions of semiclassical calculations.