B. Marx,
K. S. Schulze,
I. Uschmann,
T. Kämpfer,
O. Wehrhan,
H. C. Wille,
K. Schlage,
R. Röhlsberger,
E. Weckert,
E. Förster,
T. Stöhlker,
and G.G. Paulus
High precision measurement of undulator polarization in the regime of hard x-rays
Appl. Phys. Lett., 105 :024103 (July 2014)
High precision measurement of undulator polarization in the regime of hard x-rays
Appl. Phys. Lett., 105 :024103 (July 2014)