B. Marx,
K. S. Schulze,
I. Uschmann,
T. Kämpfer,
R. Lötzsch,
O. Wehrhan,
W. Wagner,
C. Detlefs,
T. Roth,
J. Härtwig,
E. Förster,
T. Stöhlker,
and G.G. Paulus
High-Precision X-Ray Polarimetry
Phys. Rev. Lett., 110 :254801 (June 2013)
High-Precision X-Ray Polarimetry
Phys. Rev. Lett., 110 :254801 (June 2013)
Abstract:
The polarization purity of 6.457- and 12.914-keV x rays has been improved to the level of 2.4×10-10 and 5.7×10-10. The polarizers are channel-cut silicon crystals using six 90° reflections. Their performance and possible applications are demonstrated in the measurement of the optical activity of a sucrose solution.