Z. W. Wu,
A. V. Volotka,
A. Surzhykov,
and S. Fritzsche
Angle-resolved x-ray spectroscopic scheme to determine overlapping hyperfine splittings in highly charged heliumlike ions
Phys. Rev. A, 96 :012503 (July 2017)
Angle-resolved x-ray spectroscopic scheme to determine overlapping hyperfine splittings in highly charged heliumlike ions
Phys. Rev. A, 96 :012503 (July 2017)
Abstract:
An angle-resolved x-ray spectroscopic scheme is presented for determining the hyperfine splitting of highly charged ions. For heliumlike ions, in particular, we propose to measure either the angular distribution or polarization of the 1s2p ^3P_1,F -> 1s^2 ^1S_0,F_f emission following the stimulated decay of the initial 1s 2s ^1S_0,F_i level. It is found that both the angular and polarization characteristics of the emitted x-ray photons strongly depend on the (relative) splitting of the partially overlapping hyperfine 1s 2p ^3P_1,F resonances and may thus help resolve their hyperfine structure. The proposed scheme is feasible with present-day photon detectors and allows a measurement of the hyperfine splitting of heliumlike ions with a relative accuracy of about 10^-4.