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Compton Polarimetry of Hard X-Rays

The investigation of polarization phenomena allows for unique insights into the dynamics of atomic processes. In the range of hard X-ray radiation, novel segmented semiconductor detectors have become available for polarization measurements recently. These devices harness the polarization sensitivity of the Compton effect. The group operates various types of Compton polarimeters. Apart from researching polarization effects in atomic collisions with highly-charged heavy ions or electrons, at synchrotron sites experiments regarding photon—photon scattering are conducted.

In parallel, the polarimeters are subject to continuous advancement and expansion, for example by implementing digital signal processing techniques.

Image of photons scattered at different Compton angles inside the detector crystal [U. Spillmann et al.].
Image of photons scattered at different Compton angles inside the detector crystal [U. Spillmann et al.].

Contact:

Dr. Günter Weber
Tel: +49 3641 947-605
g.weber@gsi.de

Prof. Dr. Thomas Stöhlker
Tel: +49 3641 947-600
t.stoehlker@gsi.de